Fig. 4
From: Nickel-induced transcriptional changes persist post exposure through epigenetic reprogramming
H3K4me3 profiles at the transiently downregulated (TD) genes. a Genome browser image showing expression levels (RNA-Seq) of TAGLN, a representative TD gene. b Genome browser image showing H3K4me3 at TAGLN. c, d Scatter plots showing changes in H3K4me3 levels in all-genes (grey) and TD genes (red). x-Axes in c and d show changes in the levels of H3K4me3 in Ni-E cells compared to UT cells. y-Axis in c shows changes in the levels of H3K4me3 in Ni-W cells compared to UT cells, and y-axis in d shows changes in the levels of H3K4me3 in Ni-W cells compared to Ni-E cells. Intensity of red dots represents the gene expression values in UT cells, with darker colors indicating higher expression. e Quantitation of c and d. P values were calculated using one-tailed Student’s t-test. n.s. not significant. TD (transiently downregulated), genes downregulated during nickel exposure, with the expression reverting to normal levels after the termination of exposure; CDS, chromatin dynamic score (see “Methods” for details)